Volume 1, Issue 4 (5-2009)                   jcb 2009, 1(4): 77-94 | Back to browse issues page

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Genetical Analysis for Yield Traits in Tropical Beet using of GGE-Biplot Analysis of Diallel Cross Data. jcb. 2009; 1 (4) :77-94
URL: http://jcb.sanru.ac.ir/article-1-129-en.html
Abstract:   (6018 Views)
In order to study the genetic control of root yield, sugar yield and white sugar yield in tropical beet, the biplot of diallel data was used. 36 hybrids derived from crosses among 9 sugar beet genotypes along with four control treatments were evaluated at Safiabad Agricultural Research Center, Dezful, Iran during 2008-2009 growing season. The experimental design was a triple lattice design with three replications. Analysis of variance showed significant differences among genotypes for the traits at 1% probability level. Analysis of combining ability using Griffing's method II Diallel crossing scheme after elimination of the control treatments indicated that general combining ability of genotypes was significant for all three yield traits at 5% probability level. Also specific combining ability was significant for root yield and sugar yield at 1% probability level and at 5% probability level for white sugar yield. The GGE bi-plot graphical were used for evaluation of O-type line potential. For root yield, 436-104 was the best general combiner. Also 7173 and 474 parents were the best specific combinatory, so that 7173×474 cross was the best hybrid for root yield, sugar yield and white sugar yield traits in sugar beet. 436 genotype was the best tester for sugar yield and white sugar yield traits.
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Type of Study: Research | Subject: General
Received: 2013/05/8 | Published: 2009/05/15

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